SentrySciences has the industry experience to configure solutions for every environmental monitoring challenge!
Protecting your critical surfaces from foreign object debris (FOD) and compliance with ISO 14644-9 requires state of the art solutions.
The risk of product contamination is proportional to the deposition rate of particles.
APMON Large Particle Monitoring
Advanced Particle Deposition Monitoring
The APMON is a complete monitoring system that counts and measures depositing particles and FOD. The sensor contains an optical system using holographic imaging which provides a reliable view of the large particle deposition on the surface of the work area. The individual sensors then connect to a base unit and computer for data acquisition, processing, and control. The real-time data collection and archive are a critical piece of demonstrating compliance with ISO 14644-9.
MFI™ Image Analysis!
Ask about our introductory image analysis program, using ParticleSentryAI!