Applications for light-based technologies are growing every day and can be found everywhere - from cell phone displays and cameras to lighting and cars that park themselves. Assembly of this critical equipment requires controlled, clean environments. Humans are the main contamination risk in these clean spaces. A gowned person walking across a cleanroom can generate approximately 5,000,000 particles ≥ 0.5 µm/min simply by walking. Advanced optics, like laser beam diffraction systems, can be affected by simple changes in temperature and humidity. These spaces need critical controls, and we can help!
Our Foreign Object Debris (FOD; ≥ 10 µm) solutions are at the forefront of real-time particle monitoring and detection, large particle deposition and automated witness plate monitoring. Our innovative products can be integrated into continuous monitoring systems for FOD in compliance with ISO 14644-9 and ISO 14644-17.
At SentrySciences, we know that cleaning and validation is key to protecting your critical assembly areas. Our portfolio of solutions also includes portable inspection tools for cleaning verification to ensure that as your process needs change and move throughout the cleanroom, your procedures can be qualified before you put critical products at risk.
Automated witness plate monitoring and particle deposition systems employ holographic imaging to detect particles >15µm and include the ability to provide alarm notification in real-time when the PDR exceeds limits and meets the ISO 14644-17 particle deposition rate standard.
In turbulent-flow cleanrooms average airflow velocities are much lower than those used in unidirectional airflow systems. Large particles divert from slower-moving airflow streamlines more readily and deposit on surfaces and work environments. They remain there until removed by manual cleaning or are stirred up by normal personnel movements, placing critical products at risk. In these environments, traditional aerosol particle counters struggle to collect a representative sample of these larger particles. By adding surface particle monitoring, manufacturers know when product is placed at risk due to particles that are randomly redistributed by personnel and equipment movements.
Robust solutions to these challenges include measurement of the Particle Deposition Rate (PDR) and real time alarm notification when PDR increases. SentrySciences has products that continuously monitor large particle deposition at your greatest points of risk.
Particles on optical surfaces cause emittance changes and scatter light. On electrical surfaces particles cause noise on electrical contacts, short circuits and even mechanical damage. These “killer” particles are typically greater than 5 µm in size, and in low airflow cleanrooms where critical manufacturing and assembly processes occur, they can directly impact product yield.
Our solutions include aerosol particle counters that monitor the effectiveness of air exchange through HEPA filtration and provide trend data to help you understand how movement in your room impacts small and large particle re-distribution.
At SentrySciences, we are experts in design, implementation, and management of cleanroom contamination monitoring tools to meet all aspects of ISO 14644. Our solutions can automate your processes and trigger alarms in real-time, when PDR increases above a pre-defined limit, or when an ISO 14644-9 Surface Cleanliness Level is exceeded or when changes in the airflow system are outside of defined limits. Let us help you design a solution that protects your critical work and ensures your cleanroom infrastructure is delivering intended results. From particles in the air to surface cleanliness, call on us to help you design your cleanroom monitoring system to protect your critical assemblies and ensure high quality and yield. Bring it together with ParticleSentryᴱᴹ!